Superfast Contact-free Material Characterization using Terahertz Radiation

Contact-free material characterization with unprecedented data rates is enabled using TOPTICA’s TeraSpeed. This superfast terahertz-sensing platform supports applications like non-destructive testing, plastic inspection or process control with a sampling rate of 100 million data points per second. The TeraSpeed complements TOPTICA’s unique portfolio of terahertz systems, which also includes TeraFlash, a time-domain terahertz platform. TeraFlash has an unsurpassed peak dynamic range of 90 dB and a bandwidth of 6 THz. If a frequency-domain terahertz platform is required, TOPTICA’s TeraScan allows for a frequency resolution better than 10 MHz and a dynamic range up to 100 dB.